The quality grades of foreign military electronic components and their domestic counterparts

In order to ensure the quality of components, my country has formulated a series of component standards. In the late 1970s, the 'Seven Specialized' 7905 technical agreement was formulated and the 'Seven Specialized' 8406 technical agreement was formulated in the early 1980s. The rudimentary form of the military device standard has been established, but the standard was formulated before the reform and opening up. There are many Limitations make it difficult to keep up with international standards. Since the 1980s, my country's standardization department has established the GJB system with reference to the US Military Standards (MIL) system. The standards for components have three forms: specifications, standards, and guidance documents. 1. Quality grading of domestic military components 2. American military standard quality grading system: MIL-PRF-19500 General Test Specification for Semiconductor Devices (lower→higher grade) monolithic microcircuit specifications (lower→higher grade) (1) B Level -2: Does not fully comply with the requirements of section 1.2.1 of MIL-STD-883, and purchases in accordance with government approval documents, including the seller’s equivalent level B requirements. (2) Level B-1: Fully comply with the requirements of Section 1.2.1 of MIL-STD-883 (Test Methods and Procedures for Microelectronic Devices), and in accordance with the standard military drawing (SMD-Standard Microcicuit Drawing), the National Defense Electronics Supply Center ( DESC-DefenceElectronic Supply Center) drawings or other documents approved by the government for procurement. That is, it is usually called Class 883, and there are 5962-xxx numbers on the device. (3) S-1 level: completely in accordance with MIL-STD-975 (NASA standard catalog of electrical and mechanical power devices) or MIL-STD-1547 (components, materials and process technical requirements for space vehicles and launch vehicles) Purchasing, and the specification and approval of the purchasing agency. MIL-PRF-38534D hybrid integrated circuit specification (lower→higher grade) resistance, capacitance, and inductance components. The failure levels of the components with reliability indicators in the MIL standard are divided into five levels. The failure rate and failure rates with reliability indicators in the MIL standard Correspondence 3. European Space Agency Components Semiconductor Discrete Devices: ESA/SCC (Europe Space Agency/Space Componet Cooperation) 5000 Standard Test Level: Level B, Level C (from high to low) Batch Acceptance Level: Level 1, Level 2 , Level 3 (from high to low) Microcircuit: ESA/SCC (Europe Space Agency/Space Componet Cooperation) 9000 standard test level: Level B, Level C (from high to low) Batch acceptance level: Level 1, Level 2, 3 Class (from high to low) resistance, capacitance, and inductance devices: ESA/SCC (Europe Space Agency/Space Componet Cooperation) 3000 and 4000 standard test levels: Class B, Class C (from high to low) Batch acceptance level: Class 1, Level 2 and Level 3 (from high to low) 4. Corresponding relationship between foreign military components and Chinese military components quality level Corresponding relationship between semiconductor discrete device quality level Corresponding relationship microcircuit quality corresponding level Resistance-capacitance inductance failure rate level